Thru-reflect-line calibration for substrate integrated waveguide devices with tapered microstrip transitions

  1. Diaz Caballero, E.
  2. Belenguer, A.
  3. Esteban, H.
  4. Boria, V.E.
Revue:
Electronics Letters

ISSN: 0013-5194

Année de publication: 2013

Volumen: 49

Número: 2

Pages: 132-133

Type: Article

DOI: 10.1049/EL.2012.3027 GOOGLE SCHOLAR
La source de données: Scopus